Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

What is the Smallest Volume Into Which Light Can Be Focused, Efficiently?
Conway, J.   Vedantam, S.   Hyojune Lee   Japeck Tang   Yablonovitch, E.  
UCLA, Los Angeles;

This paper appears in: Nano-Optoelectronics Workshop, 2007. i-NOW '07. International
Publication Date: July 29 2007-Aug. 11 2007
On page(s): 77-77
Location: Beijing,
ISBN: 978-1-4244-1591-5
INSPEC Accession Number: 9798672
Digital Object Identifier: 10.1109/INOW.2007.4302887
Current Version Published: 2007-09-17

Abstract
Electromagnetic waves, running in close proximity to a metal surface, can have surprisingly short wavelengths, as short as lambda=1 nm, at optical frequencies. Thus the phrase Optical frequencies but with X-ray wavelengths, is appropriate. In effect these plasmon waves can experience a high effective refractive index, nGt100, dependent on the exact guiding structure. We find moreover, that at these short wavelengths, the skin depth or exponential decay depth, inside the metal can be <1 nm, much shorter than the conventional collisionless skin depth, c/omegarho ~ 25 nm in Silver. We propose an innovative dimple geometry as a focusing structure that makes it possible to focus visible frequencies down to ~5 nm dimensions, with an efficiency of ~50%. This focusing structure is much more efficient, and leads to a much smaller spot size, than can be achieved with conventional pinhole structures. We introduce a new figure-of-merit for focusing that properly accounts for plasmonic energy dissipation. We find that the limit of focusing is reached when the electromagnetic plasmonic group velocity vg becomes as slow as the electron Fermi velocity, vF.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (103 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved