Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article
Email/Printer Friendly Format  
 

Ultra-High Nonlinear As2 S3 Planar Waveguide for 160-Gb/s Optical Time-Division Demultiplexing by Four-Wave Mixing
Pelusi, M.D.   Ta'eed, V.G.   Lamont, M.R.E.   Madden, S.   Choi, D.-Y.   Luther-Davies, B.   Eggleton, B.J.  
Univ.of Sydney, Sydney;

This paper appears in: Photonics Technology Letters, IEEE
Publication Date: Oct.1, 2007
Volume: 19,  Issue: 19
On page(s): 1496-1498
ISSN: 1041-1135
INSPEC Accession Number: 9633177
Digital Object Identifier: 10.1109/LPT.2007.903881
Current Version Published: 2007-09-17

Abstract
A low loss As2S3 planar waveguide with ultra-high optical Kerr nonlinearity ~2000 W-1 ldr km-1 and only 50-mm length demonstrates high-performance time-division demultiplexing of a 160-Gb/s signal into its tributary 10-Gb/s channels via four-wave mixing (FWM) with copropagating pump pulses. Although the waveguide has a high normal dispersion parameter, its combined high nonlinearity in such short length is shown to enable efficient FWM of high-speed optical signals for all-optical demultiplexing.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (330 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved