Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Capacity-Based Uplink Scheduling Using Long-Term Channel Knowledge
Bandemer, B.   Visuri, S.  
Nokia Res. Center, Espoo;

This paper appears in: Communications, 2007. ICC '07. IEEE International Conference on
Publication Date: 24-28 June 2007
On page(s): 785-790
Location: Glasgow,
ISBN: 1-4244-0353-7
INSPEC Accession Number: 9874826
Digital Object Identifier: 10.1109/ICC.2007.134
Current Version Published: 2007-08-13

Abstract
In the multi-user MIMO uplink channel, the presence of multiple receive antennas enables the base station to serve a number of users simultaneously, thus increasing overall system throughput. In practice, users have to be scheduled instead of being served all at once. In this work, a novel scheduling metric is proposed based on ergodic sum capacity. A low-SNR Taylor series of the capacity expression is combined with a receiver-correlation channel model to obtain a robust measure of spatial compatibility. Long-term channel knowledge at the base station is sufficient for metric evaluation, which significantly reduces the amount of required channel sounding, compared to previously proposed schemes.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (192 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved