Contact-Less Characterization of Long Coated Conductor Tapes Using a Hall Sensor Array and a Pick-Up Coil

A contact-less characterization technique is indispensable for the development and the application of long coated conductors. The Hall sensor array technique is a very sufficient one for high-speed measurements of the critical current density distribution along the length of coated conductor tapes. Careful analysis showed that the critical current induced in this technique corresponded to a rather low voltage criterion in comparison with the usual value, 1 muV/cm . Therefore, it is necessary to estimate the n-value in addition to the J
_c
value to fully characterize tapes. We have already developed a contact-less technique for the measurement of n-value of thin films. We apply this technique to coated conductors.