Single-Buffer-Architectured Coated Conductor Based on IBAD and PLD Method

In order to lower the production costs of coated conductors based on the ion-beam assisted deposition (IBAD) and pulsed laser deposition (PLD) method, we examined a single-buffered architecture (REBCO/IBAD/Hastelloy) without a second buffer layer of . While all samples exhibited similar degrees of the textures, transport current properties were found to be strongly dependent on the REBCO layer and IBAD template materials. With a structure of Ag/PLD-GdBa
₂
Cu
₃
O
₇
/IBAD - Gd
₂
Zr
₂
O
₇
/Hastelloy, we obtained critical currents of 165 Amps (0.8 -thick) and critical current densities of 3.4 (0.4 -thick) for short-piece samples in standard four-probe dc measurements.