Microstructural Evolution With the Change in Thickness of Superconducting Films

Microstructural evolution with the change in thickness of superconducting YBa
₂
Cu
₃
O
_7-X
films on single-crystal SrTiO
₃
substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.