Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

High-Performance Chemical-Bath-Deposited Zinc Oxide Thin-Film Transistors
Redinger, D.   Subramanian, V.  
Univ. of California-Berkeley, Berkeley;

This paper appears in: Electron Devices, IEEE Transactions on
Publication Date: June 2007
Volume: 54,  Issue: 6
On page(s): 1301-1307
Location: Lausanne, Switzerland,
ISSN: 0018-9383
INSPEC Accession Number: 9882360
Digital Object Identifier: 10.1109/TED.2007.895861
Current Version Published: 2007-05-29

Abstract
Solution-processed transparent zinc oxide (ZnO) transistors are demonstrated using a chemical bath deposition process for ZnO deposition. The process is glass compatible and amenable to producing fully transparent electronics. Mobility as high as 3.5 cm2/V ldr s with on-off ratios of ~105 is realized. The transparency of ZnO allows for complete coverage of the pixel by the pixel drive transistors; analysis shows that the performance achieved herein is sufficient even to drive high-brightness organic light-emitting diode (OLED) displays by exploiting the high mobility and optical transparency of these devices. This makes this technology extremely attractive for use in active-matrix OLED display applications.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (768 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved