Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Gait Design and Modeling of a 12-Tetrahedron Walker Robot
Abrahantes, M.   Silver, A.   Wendt, L.  
Dept. of Eng., Hope Coll., Holland, MI;

This paper appears in: System Theory, 2007. SSST '07. Thirty-Ninth Southeastern Symposium on
Publication Date: 4-6 March 2007
On page(s): 21-25
Location: Macon, GA,
ISSN: 0094-2898
ISBN: 1-4244-1126-2
INSPEC Accession Number: 9572619
Digital Object Identifier: 10.1109/SSST.2007.352310
Current Version Published: 2007-04-23

Abstract
This work describes the use of a simulating walking robot to model the tetrahedron walker robots being developed at NASA/Goddard Space Flight Center. As a contribution to the gait generation and motion control of the tetrahedron walker robots, a concept has been formulated to implement in the case of choreographic designed gaits. This work is part of the contribution of this Hope College team to the development of tetrahedron walker robots by the ANTS group at Goddard. http://ants.gsfc.nasa.gov.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (4859 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved