Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Analytic-Wavelet-Ridge-Based Detection of Dynamic Eccentricity in Brushless Direct Current (BLDC) Motors Functioning Under Dynamic Operating Conditions
Rajagopalan, S.   Aller, J.M.   Restrepo, J.A.   Habetler, T.G.   Harley, R.G.  
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: June 2007
Volume: 54,  Issue: 3
On page(s): 1410-1419
ISSN: 0278-0046
INSPEC Accession Number: 9477518
Digital Object Identifier: 10.1109/TIE.2007.894699
Current Version Published: 2007-04-10

Abstract
A new method using the analytic wavelet transform of the stator-current signal is proposed for detecting dynamic eccentricity in brushless direct current (BLDC) motors operating under rapidly varying speed and load conditions. As wavelets are inherently suited for nonstationary signal analysis, this method does not require the use of any windows, nor is it dependent on any assumption of local stationarity as in the case of the short-time Fourier transform. The proposed technique uses analytic wavelets, which are smooth wavelets that possess both magnitude and phase information. This makes them particularly suitable for motor-fault diagnostics. Experimental results are provided to show that the proposed method works over a wide speed range of motor operation and provides an effective and robust way of detecting rotor faults such as dynamic eccentricity in BLDC motors

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (582 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved