Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Distorted Metrics on Trees and Phylogenetic Forests
Mossel, E.  
Dept. of Stat., California Univ., Berkeley, CA;

This paper appears in: Computational Biology and Bioinformatics, IEEE/ACM Transactions on
Publication Date: Jan.-March 2007
Volume: 4,  Issue: 1
On page(s): 108-116
ISSN: 1545-5963
INSPEC Accession Number: 9357939
Digital Object Identifier: 10.1109/TCBB.2007.1010
Current Version Published: 2007-02-20

Abstract
We study distorted metrics on binary trees in the context of phylogenetic reconstruction. Given a binary tree T on n leaves with a path metric d, consider the pairwise distances {d(u,v)} between leaves. It is well known that these determine the tree and the d length of all edges. Here, we consider distortions d of d such that, for all leaves u and v, it holds that |d(u,v)-dmacr(u,v)|<f/2 if either d(u,v)<M+f/2 or d(u,v)<M+f/2, where d satisfies flesd(e)lesg for all edges e. Given such distortions, we show how to reconstruct in polynomial time a forest T1.....T0 such that the true tree T may be obtained from that forest by adding alpha-1 edges and alpha-1les2-Omega(M/g)n. Our distorted metric result implies a reconstruction algorithm of phylogenetic forests with a small number of trees from sequences of length logarithmic in the number of species. The reconstruction algorithm is applicable for the general Markov model. Both the distorted metric result and its applications to phylogeny are almost tight

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (245 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved