Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Coverage Diameters of Polygons
Vongmasa, P.   Sudsang, A.  
Dept. of Comput. Eng., Chulalongkorn Univ., Bangkok;

This paper appears in: Intelligent Robots and Systems, 2006 IEEE/RSJ International Conference on
Publication Date: 9-15 Oct. 2006
On page(s): 4036-4041
Location: Beijing,
ISBN: 1-4244-0258-1
INSPEC Accession Number: 9419406
Digital Object Identifier: 10.1109/IROS.2006.281864
Current Version Published: 2007-01-15

Abstract
This paper formalizes and proposes an algorithm to compute coverage diameters of polygons in 2D. Roughly speaking, the coverage diameter of a polygon is the longest possible distance between two points through which the polygon cannot pass in between. The primary use of coverage diameter is to form a cage for transporting an object, not necessarily convex, with multiple disc-shaped robots. The main idea of the computation of coverage diameter is to convert the problem into a graph structure, then perform the search for a solution path in that graph. The proposed algorithm runs in O(n2 log n) time for the input polygon with n vertices

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (158 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved