Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

C2FS: An Algorithm for Feature Selection in Cascade Neural Networks
Backstrom, L.   Caruana, R.  
Computer Science, Cornell University, lb87@cornell.edu;

This paper appears in: Neural Networks, 2006. IJCNN '06. International Joint Conference on
Publication Date: 16-21 July 2006
On page(s): 4748- 4753
ISBN: 0-7803-9490-9
Current Version Published: 2006-10-30

Abstract
Wrapper-based feature selection is attractive because wrapper methods are able to optimize the features they select to the specific learning algorithm. Unfortunately, wrapper methods are prohibitively expensive to use with neural nets. We present an internal wrapper feature selection method for Cascade Correlation (C2) nets called C2FS that is 2-3 orders of magnitude faster than external wrapper feature selection. This new internal wrapper feature selection method selects features at the same time hidden units are being added to the growing C2 net architecture. Experiments with five test problems show that C2FS feature selection usually improves accuracy and squared error while dramatically reducing the number of features needed for good performance. Comparison to feature selection via an information theoretic ordering on features (gain ratio) shows that C2FS usually yields better performance and always uses substantially fewer features.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (480 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved