Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Dual-Module-Based Maximum Power Point Tracking Control of Photovoltaic Systems
Joung-Hu Park   Jun-Youn Ahn   Bo-Hyung Cho   Gwon-Jong Yu  
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ.;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: June 2006
Volume: 53,  Issue: 4
On page(s): 1036-1047
ISSN: 0278-0046
INSPEC Accession Number: 9064480
Digital Object Identifier: 10.1109/TIE.2006.878330
Current Version Published: 2006-08-07

Abstract
The improved maximum power point tracking (MPPT) control method for small-scale dual-module photovoltaic (PV) systems is presented in this paper. With this method, the voltage and current information of each module are shared and utilized for the detection of the maximum-power point (MPP) without measuring power. This approach can be implemented in a simple structure, especially due to the elimination of memory and multiplication devices. The proposed method is verified by a hardware prototype of grid-connected dual-module PV systems with the proposed analog-implemented MPPT controller. In addition, practical issues of the proposed scheme are considered

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1402 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved