Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Real-Time Identification of Optimal Operating Points in Photovoltaic Power Systems
Weidong Xiao   Lind, M.G.J.   Dunford, W.G.   Capel, A.  
Univ. of British Columbia, Vancouver, BC;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: June 2006
Volume: 53,  Issue: 4
On page(s): 1017-1026
ISSN: 0278-0046
INSPEC Accession Number: 9064478
Digital Object Identifier: 10.1109/TIE.2006.878355
Current Version Published: 2006-08-07

Abstract
Photovoltaic power systems are usually integrated with some specific control algorithms to deliver the maximum possible power. Several maximum power point tracking (MPPT) methods that force the operating point to oscillate have been presented in the past few decades. In the MPPT system, the ideal operation is to determine the maximum power point (MPP) of the photovoltaic (PV) array directly rather than to track it by using the active operation of trial and error, which causes undesirable oscillation around the MPP. Since the output features of a PV cell vary with environment changes in irradiance and temperature from time to time, real-time operation is required to trace the variations of local MPPs in PV power systems. The method of real-time estimation proposed in this paper uses polynomials to demonstrate the power-voltage relationship of PV panels and implements the recursive least-squares method and Newton-Raphson method to identify the voltage of the optimal operating point. The effectiveness of the proposed methods is successfully demonstrated by computer simulations and experimental evaluations of two major types of PV panels, namely: 1) crystalline silicon and 2) copper-indium-diselenide thin film

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (523 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved