Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Approximately universal codes over slow-fading channels
Tavildar, S.   Viswanath, P.  
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA;

This paper appears in: Information Theory, IEEE Transactions on
Publication Date: July 2006
Volume: 52,  Issue: 7
On page(s): 3233- 3258
ISSN: 0018-9448
INSPEC Accession Number: 8990584
Digital Object Identifier: 10.1109/TIT.2006.876226
Current Version Published: 2006-07-05

Abstract
Performance of reliable communication over a coherent slow-fading multiple-input multiple-output (MIMO) channel at high signal-to-noise ratio (SNR) is succinctly captured as a fundamental tradeoff between diversity and multiplexing gains. This paper studies the problem of designing codes that optimally tradeoff the diversity and multiplexing gains. The main contribution is a precise characterization of codes that are universally tradeoff-optimal, i.e., they optimally tradeoff the diversity and multiplexing gains for every statistical characterization of the fading channel. This characterization is referred to as approximate universality; the approximation is in the connection between error probability and outage capacity with diversity and multiplexing gains, respectively. The characterization of approximate universality is then used to construct new coding schemes as well as to show optimality of several schemes proposed in the space-time coding literature.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (584 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved