Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

A General Framework for Scalability and Performance Analysis of DHT Routing Systems
Kong, J.S.   Bridgewater, J.S.A.   Roychowdhury, V.P.  
Dept. of Electr. Eng., California Univ., Los Angeles, CA;

This paper appears in: Dependable Systems and Networks, 2006. DSN 2006. International Conference on
Publication Date: 25-28 June 2006
On page(s): 343-354
Location: Philadelphia, PA,
ISBN: 0-7695-2607-1
INSPEC Accession Number: 9189231
Digital Object Identifier: 10.1109/DSN.2006.4
Current Version Published: 2006-07-10

Abstract
In recent years, many DHT-based P2P systems have been proposed, analyzed, and certain deployments have reached a global scale with nearly one million nodes. One is thus faced with the question of which particular DHT system to choose, and whether some are inherently more robust and scalable. Toward developing such a comparative framework, we present the reachable component method (RCM) for analyzing the performance of different DHT routing systems subject to random failures. We apply RCM to five DHT systems and obtain analytical expressions that characterize their routability as a continuous function of system size and node failure probability. An important consequence is that in the large-network limit, the routability of certain DHT systems go to zero for any non-zero probability of node failure. These DHT routing algorithms are therefore unscalable, while some others, including Kademlia, which powers the popular eDonkey P2P system, are found to be scalable

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (314 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved