Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Debunking the nerd stereotype with pair programming
Williams, L.  
Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA;

This paper appears in: Computer
Publication Date: May 2006
Volume: 39,  Issue: 5
On page(s): 83- 85
ISSN: 0018-9162
INSPEC Accession Number: 8940696
Digital Object Identifier: 10.1109/MC.2006.160
Current Version Published: 2006-05-15

Abstract
Our studies show that using pair programming as a structure for incorporating collaboration in the classroom helps increase and broaden participation in computing fields and helps debunk the myth that programmers work alone all the time. It's also a way for students to get a better view of and feel more confident in their preparation for working in the real world. The face of the IT workforce is changing. As the millennial generation makes its way into the working world, the archetype of the nerd as the introverted, obsessed computer programmer must share equal space with the chatty, social software engineer.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (304 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved