Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Automated multivariate profiling of drug effects from fluorescence microscopy images
Lit-Hsin Loo   Wu, L.F.   Altschuler, S.J.  
Dept. of Pharmacology, Texas Univ., Dallas, TX;

This paper appears in: Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
Publication Date: 6-9 April 2006
On page(s): 251-254
Location: Arlington, VA,
ISBN: 0-7803-9576-X
INSPEC Accession Number: 9073103
Digital Object Identifier: 10.1109/ISBI.2006.1624900
Current Version Published: 2006-05-08

Abstract
Fluorescence microscopy is a useful tool for building quantitative profiles of drug effects. Although features with rich information can be extracted from fluorescence microscopy images, most current profiling methods build profiles from the extracted features using either univariate or non-automated methods. We propose a new multivariate, automated and scalable method for building drug profiles by using a decision hyperplane. The method was evaluated by using 23 compounds belonging to four groups of known mechanisms. We produced quantitative profiles that group drugs with similar mechanisms together, and separate drugs with dissimilar mechanisms from each other. These profiles resulted in better characterizations of the drug effects than profiles obtained from a previous univariate method

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1495 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved