Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem
Ibrahim, W.   El-Chouemi, A.   El-Sayed, H.  

This paper appears in: Computer Systems and Applications, 2006. IEEE International Conference on.
Publication Date: March 8, 2006
On page(s): 402- 408
ISSN:
ISBN: 1-4244-0211-5
Current Version Published: 2006-04-18