Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Weak inversion MOS varactors for 0.5 V analog integrated filters
Chatterjee, S.   Musah, T.   Tsividis, Y.   Kinget, P.  
Columbia Univ., New York, NY, USA;

This paper appears in: VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on
Publication Date: 16-18 June 2005
On page(s): 272- 275
ISSN:
ISBN: 4-900784-01-X
INSPEC Accession Number: 8573506
Digital Object Identifier: 10.1109/VLSIC.2005.1469384
Current Version Published: 2005-07-25

Abstract
This work proposes a weak-inversion MOS capacitor-based varactor, tuned through the body voltage, for the realization of tunable filters at supply voltages down to 0.5 V. Weak inversion operation results in a distributed series resistance and a model is derived to accurately calculate this frequency dependent resistance. The model matches well with experimental results from test devices in a 0.18 μm CMOS technology. Channel segmentation is used to simulate the varactor. Use of the varactor is demonstrated in the design of tunable filters and good agreement is obtained between simulated and measured performance.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (510 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved