Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Tracking objects and faces using color histograms enhanced with specularity detection
Jae Byung Park   Youngrock Yoon  
Robot Vision Lab., Purdue Univ., West Lafayette, IN, USA;

This paper appears in: Robotics, Automation and Mechatronics, 2004 IEEE Conference on
Publication Date: 1-3 Dec. 2004
Volume: 2,  On page(s): 975- 980 vol.2
ISSN:
ISBN: 0-7803-8645-0
INSPEC Accession Number: 8426360
Current Version Published: 2005-06-13

Abstract
This paper presents a robust histogram based tracking algorithm that is capable of detecting specular highlights on objects or faces to be tracked. The materials with shiny and smooth surfaces such as car exterior, ceramics or glasses often exhibit specularities which are highly saturated regions in the image that are produced by mirrorlike reflections. Whenever confronted with such specular highlights on the target objects, the results of segmentation and tracking become inaccurate and unreliable. Speaking of real-time color object tracking, there are two major issues that are associated with such specular highlights. First issue is how to detect specular highlights suddenly appearing in the image sequence. Second one is how the detected specular highlights can be correspondingly considered to improve the tracking performance. In this paper, we describe our specularity detection method that can he applied to every pair of consecutive frames in the tracking sequence. Experimental results of two tracking systems: (1) with specularity detection and (2) without handling specularities are compared to show the improvement. This method has been successfully tested on multiple tracking tasks with monochromatic objects.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (513 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved