Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

GA-based evolutionary identification algorithm for unknown structured mechatronic systems
Iwasaki, M.   Miwa, M.   Matsui, N.  
Dept. of Comput. Sci. & Eng., Nagoya Inst. of Technol., Japan;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Feb. 2005
Volume: 52,  Issue: 1
On page(s): 300- 305
ISSN: 0278-0046
INSPEC Accession Number: 8275555
Digital Object Identifier: 10.1109/TIE.2004.841075
Current Version Published: 2005-02-07

Abstract
Soft computing techniques, e.g., neural networks, fuzzy inference, evolutionary computation, and chaos theory, have been applied to a wide variety of control systems in industry because of their control capability and flexibility. They are also powerful to handle the complicated mechatronic systems with various nonlinearities which are difficult to model using mathematical formulas. In order to achieve the system identification of unknown structured mechatronic systems, This work presents a novel evolutionary algorithm using genetic algorithms (GAs), where the optimal mathematical structure of plant mechanisms and the combination of parameters can be autonomously determined by means of the optimization ability of the GA. The effectiveness of the proposed identification has been verified by experiments with comparative studies, using the typical mechanical systems with velocity controller.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (360 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved