Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Friction modeling and compensation for haptic display based on support vector machine
Bi, D.   Li, Y.F.   Tso, S.K.   Wang, G.L.  
Dept. of Manuf. Eng. & Eng. Manage., City Univ. of Hong Kong, China;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: April 2004
Volume: 51,  Issue: 2
On page(s): 491- 500
ISSN: 0278-0046
INSPEC Accession Number: 7964605
Digital Object Identifier: 10.1109/TIE.2004.825277
Current Version Published: 2004-04-05

Abstract
As the presence of friction in a haptic display device seriously affects its performance, proper compensation of the frictional effects in such a device is of practical importance for advanced virtual reality applications where haptic display plays a critical role. This paper addresses the issue of friction modeling and compensation for haptic control system designs. A new method based on the Support Vector Machine (SVM) is developed in a controller design based on a two-port network to achieve accurate haptic display. The approximation model of friction is established offline through SVM learning and is used for online feed forward friction compensation. The advantages of this novel method are demonstrated through the experiments performed.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (280 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved