Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

HSS--A High-Speed Simulator
Barzilai, Z.   Carter, J.L.   Rosen, B.K.   Rutledge, J.D.  

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: July 1987
Volume: 6,  Issue: 4
On page(s): 601- 617
ISSN: 0278-0070
Current Version Published: 2004-03-03

Abstract
The High-Speed Simulator (HSS) is a fast and flexible system for gate-level fault simulation. Originally limited to combinational logic, it is being extended to handle sequential logic. It may also prove useful as a functional simulator. The speed of HSS is obtained by converting the cycle-free portions of a circuit into optimized machine code for a general-purpose computer. This compiled code simulates the circuit's response for 16 or 32 test patterns in parallel. Faults are injected into the circuit by changing the machine instruction corresponding to the fault location. From the range of speeds seen in recent measurements, we take 240 million gates per second as a fair general estimate of the speed of 2-valued simulation running on a 3081/K computer. For 3-valued simulation, divide by 2.9. The paper discusses the merits and drawbacks of the HSS strategy. It also sketches the extensions of HSS to model sequential logic and the various applications of HSS. These include functional verification, design for testability, good machine signatures, and accurate simulation of transistor-level defects in certain CMOS technologies. Finally, there is some discussion of how the simulation requirements of future designs can be met, and of the lessons to be drawn from long-term experimentation with HSS.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (3024 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved