Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

C-Testability of Two-Dimensional Iterative Arrays
Elhuni, H.   Vergis, A.   Kinney, L.  

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: October 1986
Volume: 5,  Issue: 4
On page(s): 573- 581
ISSN: 0278-0070
Current Version Published: 2004-03-03

Abstract
The issue of testing two-dimensional iterative arrays with a constant number of test vectors independent of the array size (C-testability) is discussed in this paper. Sufficient conditions for C-testability are stated. It is shown that any two-dimensional array can be modified to become C-testable. An extension to systolic (synchronous) arrays is made. The approach simplifies testing systolic arrays by using one test vector to test many cells of the array in a periodic fashion. A two-dimensional array for matrix multiplication is used to illustrate the approach for systolic arrays.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1184 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved