Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

PART: Programmable Array Testing Based on a Partitioning Algorithm
Somenzi, F.   Silvano Gai   Mezzalama, M.   Prinetto, P.  

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: April 1984
Volume: 3,  Issue: 2
On page(s): 142- 149
ISSN: 0278-0070
Current Version Published: 2004-03-03

Abstract
PART is a system for PLA testing and design verification, intended to be properly interfaced with other existing tools to generate a comprehensive design environment. To this purpose, it provides several facilities, among which the capability of generating a fault population on the basis of layout information. PART aims at producing a very compact test set for all detectable crosspoint defects, using limited amounts of run time and storage. This is achieved by means of an efficient partitioning algorithm together with powerful heuristics. Test minimality is ensured by a simple procedure. In the present paper these are discussed, experimental results are given and a comparison with competing strategies is made.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1000 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved