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A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
Melstrand, O. O'Neill, E. Sobelman, G.E. Dokos, D.

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: January 1984
Volume: 3, Issue: 1
On page(s): 47- 51
ISSN: 0278-0070
Current Version Published: 2004-03-03

Abstract
An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.

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