Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

A single-switch continuous-conduction-mode boost converter with reduced reverse-recovery and switching losses
Dylan Dah-Chuan Lu   Cheng, D.K.-W.   Yim-Shu Lee  
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Aug. 2003
Volume: 50,  Issue: 4
On page(s): 767- 776
ISSN: 0278-0046
INSPEC Accession Number: 7708557
Digital Object Identifier: 10.1109/TIE.2003.814989
Current Version Published: 2003-07-28

Abstract
A single-switch continuous-conduction-mode boost converter with reduced reverse-recovery and switching losses is proposed. By utilizing the leakage inductances of a pair of coupled inductors and two additional rectifiers, the turn-off rates (di/dt) of the boost output rectifier and the additional rectifiers are slowed down to reduce the reverse-recovery loss. The boost power transistor is also operated under a low-voltage turn-on condition to reduce the switching loss. Experimental results are presented to confirm the theoretical analysis and the performance of the proposed converter.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (944 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved