Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Electron-beam position monitoring and feedback control in DukeFree-Electron Laser Facility
Moallem, M.  
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, Ont.;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Apr 2002
Volume: 49,  Issue: 2
On page(s): 423-432
ISSN: 0278-0046
References Cited: 15
CODEN: ITIED6
INSPEC Accession Number: 7232990
Digital Object Identifier: 10.1109/41.993276
Current Version Published: 2002-08-07

Abstract
This paper addresses data acquisition and feedback control of electron-beam positions in the Duke University Free-Electron Laser Facility. The control system consists of a distributed system of VME-based hardware and processors connected through a network to host workstations. The host workstations provide graphical data presentation to the user and are also used for high-level supervisory control. The electron-beam profile is controlled by electromagnetic forces generated by passing currents through the coils of correction magnets distributed around the ring. A desired control objective is to move the stored electron beam to specific locations in the vacuum chamber and to stabilize the orbit in the presence of disturbances. The technical details of implementing the data acquisition and control scheme and their integration with the existing control system modules are presented along with experimental results

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (832 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved