Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Gate drive level intelligence and current sensing for matrixconverter current commutation
Wheeler, P.W.   Clare, J.C.   Empringharn, L.   Bland, M.   Apap, M.  
Sch. of Electr. & Electron. Eng., Nottingham Univ.;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Apr 2002
Volume: 49,  Issue: 2
On page(s): 382-389
ISSN: 0278-0046
References Cited: 10
CODEN: ITIED6
INSPEC Accession Number: 7232985
Digital Object Identifier: 10.1109/41.993271
Current Version Published: 2002-08-07

Abstract
This paper is concerned with the process of current commutation in matrix converters. The mechanisms involved in the commutation process are described and practical waveforms are presented. A novel commutation strategy is described that uses gate drive level intelligence in the form of a field-programmable gate array. Current direction is determined using device voltages and, therefore, the measurement problems associated with all other commutation methods are overcome. Practical results from an 18-kW matrix converter induction motor drive are presented

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (350 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved