Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Automatic nonlinear auto-tuning method for Hammerstein modeling ofelectrical drives
Balestrino, A.   Landi, A.   Ould-Zmirli, M.   Sani, L.  
Dipt. di Sistemi Elettrici e Automazione, Pisa Univ.;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Jun 2001
Volume: 48,  Issue: 3
On page(s): 645-655
ISSN: 0278-0046
References Cited: 14
CODEN: ITIED6
INSPEC Accession Number: 6951739
Digital Object Identifier: 10.1109/41.925592
Current Version Published: 2002-08-07

Abstract
Accurate modeling of electrical drives for online testing is a relevant problem, because of their nonlinear behavior. Efficient modeling for simulation, performance evaluation, and testing must consider accurate as well as simple models. This paper proposes the application of auto-tune methods to identify equivalent Hammerstein models, where the nonlinear process is approximated by a static nonlinear element followed by a linear dynamic second or third-order model. The effectiveness of the presented procedure is first verified by simulation results, showing that Hammerstein models overcome the limitations inherent to small-signal linearizations. A standard implementation of such technique considers a relay adjustment for attempts in a heuristic way. In this paper, two innovations are proposed: the relay adjustment is automatically shifted and the method is applied for complex electric drives. Experimental results are shown in the case of a drive constituted by a DC/AC inverter supplying a single-phase induction motor and of a step-down chopper

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (220 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved