Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Micro thermal management of high-power diode laser bars
Lorenzen, D.   Bonhaus, J.   Fahrner, W.R.   Kaulfersch, E.   Worner, E.   Koidl, P.   Unger, K.   Muller, D.   Rolke, S.   Schmidt, H.   Grellmann, M.  
Jenoptik Laserdiode GmbH, Jena;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Apr 2001
Volume: 48,  Issue: 2
On page(s): 286-297
ISSN: 0278-0046
References Cited: 14
CODEN: ITIED6
INSPEC Accession Number: 6895156
Digital Object Identifier: 10.1109/41.915407
Current Version Published: 2002-08-07

Abstract
Lifetime and reliability of high-power diode laser bars are sensitively related to operating temperature, mounting stress, and solder electromigration. These three factors have been taken into account for the development of a new packaging technology for 1 cm laser bars of gallium arsenide. We examine the use of chemical-vapor-deposited (CVD) diamond as heatspreaders in order to reduce thermal resistance of a microchannel cooler for liquid cooling. We show that it is possible to perform hard soldering on a CVD-diamond with a new technique. Additionally, we present a controlled water cooling system fit to the flow characteristics of the cooler. It permits one to adjust the emission wavelength of the diode lasers by changing the water flux

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (280 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved