Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

The fusion of computationally intelligent methodologies andsliding-mode control-a survey
Kaynak, O.   Erbatur, K.   Ertugnrl, M.  
Fac. of Eng., Bogazici Univ., Istanbul;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Feb 2001
Volume: 48,  Issue: 1
On page(s): 4-17
ISSN: 0278-0046
References Cited: 107
CODEN: ITIED6
INSPEC Accession Number: 6860875
Digital Object Identifier: 10.1109/41.904539
Current Version Published: 2002-08-07

Abstract
This paper surveys how some “intelligence” can be incorporated in sliding-mode controllers (SMCs) by the use of computational intelligence methodologies in order to alleviate the well-known problems met in practical implementations of SMCs. The use of variable-structure system theory in design and stability analysis of fuzzy controllers is also discussed by drawing parallels between fuzzy control and SMCs. An overview of the research and applications reported in the literature in this respect is presented

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (232 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved