Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A global wiring paradigm for deep submicron design
Sylvester, D.   Keutzer, K.  
Synopsys Inc., Mountain View, CA;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Feb 2000
Volume: 19,  Issue: 2
On page(s): 242-252
ISSN: 0278-0070
References Cited: 20
CODEN: ITCSDI
INSPEC Accession Number: 6552898
Digital Object Identifier: 10.1109/43.828553
Current Version Published: 2002-08-06

Abstract
Global interconnect is commonly regarded as a key potential bottleneck to the advancing performance of high-speed integrated circuits. Our previous work has suggested that local interconnect effects can be managed through a deep submicron design hierarchy that uses 50000 to 100000 gate modules as primitive building blocks. The primary goal of this paper is to examine global interconnect effects, within such a design hierarchy, to determine if there are any significant roadblocks which will prevent National Technology Roadmap for Semiconductors (NTRS) performance expectations from being met. Specifically, the issues of global resistance-capacitance delay, signal time-of-flight, inductance, clock and power distribution, and noise are studied. Results indicate that, while global clock frequencies will necessarily he lower than local clock speeds, NTRS expectations should be attainable to the 50 nm technology generation. Achieving these high clock speeds (10 GHz local clock) will be aided by the use of a newly proposed routing hierarchy which limits interconnect effects at each level of a design (local, isochronous, and global)

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (240 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved