Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

A systematic graphing technique for small-signal low-frequencycharacterization of PWM DC/DC converters
Wong, B.K.H.   Shu-Hung Chung, H.  
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Feb 2000
Volume: 47,  Issue: 1
On page(s): 45-54
ISSN: 0278-0046
References Cited: 26
CODEN: ITIED6
INSPEC Accession Number: 6507831
Digital Object Identifier: 10.1109/41.824108
Current Version Published: 2002-08-06

Abstract
This paper presents a systematic graphing technique for the small-signal low-frequency characterization of pulsewidth-modulated (PWM) DC/DC power converters. The methodology starts with using a discrete-time state-space description to formulate a small-signal sensitivity graph for each circuit topology. Each graph correlates state-variable sensitivities with the topology duration, input source and state vector at the beginning of the topology. The overall converter sensitivities in one switching cycle are obtained by cascading the respective graphs in accordance with the sequence of the topologies. As the proposed method integrates with original algorithms for obtaining the time-domain responses and the steady-state operating point of converters, it is unnecessary to have a priori understanding of the converter operation and is possible to obtain actual circuit waveforms within one switching cycle. The proposed method is exemplified by analyzing a PWM boost converter operating in continuous conduction mode and discontinuous conduction mode under open-loop and closed-loop control, respectively. Theoretical predictions are verified with experimental measurements

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (236 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved