Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Microprocessor-based modified discrete integral variable-structurecontrol for UPS
Tzuen-Lih Chern   Chang, J.   Chien-Hung Chen   Hann-Tzong Su  
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Apr 1999
Volume: 46,  Issue: 2
On page(s): 340-348
ISSN: 0278-0046
References Cited: 10
CODEN: ITIED6
INSPEC Accession Number: 6221686
Digital Object Identifier: 10.1109/41.753773
Current Version Published: 2002-08-06

Abstract
This paper presents a digital signal processor microprocessor-based high-performance uninterruptible power system (UPS). It also modifies the integral variable-structure control (IVSC) approach to be more suitable for the UPS, which is tracking a sinusoidal AC voltage with specified frequency and amplitude. Since the implementation of the control laws has tended to the digital microprocessor, the paper extends the modified IVSC to the discrete time domain. Procedures are developed for determining the control function, the switching plane and the integral control gain, so that the system has desired properties. Simulation and experimental results show that the proposed scheme can supply a high-quality voltage power source in the presence of load disturbance and parameter variation

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (316 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved