Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Diffuse reflectance from rough surfaces
Oren, M.   Nayar, S.K.  
Dept. of Comput. Sci., Columbia Univ., New York, NY;

This paper appears in: Computer Vision and Pattern Recognition, 1993. Proceedings CVPR '93., 1993 IEEE Computer Society Conference on
Publication Date: 15-17 Jun 1993
On page(s): 763-764
Meeting Date: 06/15/1993 - 06/17/1993
Location: New York, NY, USA
ISSN: 1063-6919
ISBN: 0-8186-3880-X
References Cited: 4
INSPEC Accession Number: 4864109
Digital Object Identifier: 10.1109/CVPR.1993.341163
Current Version Published: 2002-08-06

Abstract
A comprehensive model that predicts reflectance from rough diffuse surfaces is presented. It is shown that diffuse reflectance from rough surfaces increases as the viewing direction approaches the source direction. This is in contrast to Lambertian surfaces, where radiance is independent of the viewing direction. The new model is a generalization of the Lambertian model, and has significant implications for machine vision, graphics, and remote sensing

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (172 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved