Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A new robust operator for computer vision: theoretical analysis
Stewart, C.V.  
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY;

This paper appears in: Computer Vision and Pattern Recognition, 1994. Proceedings CVPR '94., 1994 IEEE Computer Society Conference on
Publication Date: 21-23 Jun 1994
On page(s): 1-8
Meeting Date: 06/21/1994 - 06/23/1994
Location: Seattle, WA, USA
ISBN: 0-8186-5825-8
References Cited: 16
INSPEC Accession Number: 4777904
Digital Object Identifier: 10.1109/CVPR.1994.323951
Current Version Published: 2002-08-06

Abstract
MINPRAN, a new robust operator, finds good fits in data sets where more than 50% of the points are outliers. Unlike other techniques that handle large outlier percentages, MINPRAN does not rely on a known error bound for the good data. Instead it assumes that the bad data are randomly (uniformly) distributed within the dynamic range of the sensor. Based on this, MINPRAN uses random sampling to search for the fit and the number of inliers to the fit that are least likely to have occurred randomly. It runs in time O(N2+SNlogN), where S is the number of random samples and N is the number of data points. We demonstrate analytically and experimentally that MINPRAN distinguishes good fits from fits to random data, and that MINPRAN finds accurate fits and nearly the correct number of inliers, regardless of the percentage of true inliers

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (588 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved