Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A new robust operator for computer vision: application to rangedata
Stewart, C.V.  
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY;

This paper appears in: Computer Vision and Pattern Recognition, 1994. Proceedings CVPR '94., 1994 IEEE Computer Society Conference on
Publication Date: 21-23 Jun 1994
On page(s): 167-173
Meeting Date: 06/21/1994 - 06/23/1994
Location: Seattle, WA, USA
ISBN: 0-8186-5825-8
References Cited: 11
INSPEC Accession Number: 4777927
Digital Object Identifier: 10.1109/CVPR.1994.323825
Current Version Published: 2002-08-06

Abstract
The basic MINPRAN (MINimize the Probability of RANdomness) technique, introduced by C.V. Stewart (1994), is extended to handle range data taken from complex scenes. Such data often includes: (1) a large numbers of outliers, (2) points from multiple surfaces interspersed over large image regions, and (3) extended regions containing only bad data. The initial version of MINPRAN handles cases (1) and (3). For (2), given an image region containing data from more than one surface, the basic technique tends to favor a single fit that “bridges” two surfaces. We analyze the extent of this problem and introduce two modifications to solve it. The new version of the algorithm, called MINPRAN2, produces extremely good results on difficult range data

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (564 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved