Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Hierarchical Gabor filters for object detection in infrared images
Braithwaite, R.N.   Bhanu, B.  
Coll. of Eng., California Univ., Riverside, CA ;

This paper appears in: Computer Vision and Pattern Recognition, 1994. Proceedings CVPR '94., 1994 IEEE Computer Society Conference on
Publication Date: 21-23 Jun 1994
On page(s): 628-631
Meeting Date: 06/21/1994 - 06/23/1994
Location: Seattle, WA, USA
ISBN: 0-8186-5825-8
References Cited: 6
INSPEC Accession Number: 4764237
Digital Object Identifier: 10.1109/CVPR.1994.323789
Current Version Published: 2002-08-06

Abstract
This paper presents a new representation called “hierarchical Gabor filters” and associated novel local measures which are used to detect potential objects of interest in images. The “first stage” of the approach uses a wavelet set of wide-bandwidth separable Gabor filters to extract local measures from an image. The “second stage” makes certain spatial groupings explicit by creating small-bandwidth, non-separable Gabor filters that are tuned to elongated contours or periodic patterns. The non-separable filter responses are obtained from a weighted combination of the separable basis filters, which preserves the computational efficiency of separable filters while providing the distinctiveness required to discriminate objects from clutter. This technique is demonstrated on images obtained from a forward looking infrared (FLIR) sensor

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (384 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved