Shape from focus
Nayar, S.K.
Nakagawa, Y.
Dept. of Comput. Sci., Columbia Univ., New York, NY;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Aug 1994
Volume: 16,
Issue: 8
On page(s): 824-831
ISSN: 0162-8828
References Cited: 18
CODEN: ITPIDJ
INSPEC Accession Number: 4761920
Digital Object Identifier: 10.1109/34.308479
Current Version Published: 2002-08-06
Abstract
The shape from focus method presented here uses different focus
levels to obtain a sequence of object images. The sum-modified-Laplacian
(SML) operator is developed to provide local measures of the quality of
image focus. The operator is applied to the image sequence to determine
a set of focus measures at each image point. A depth estimation
algorithm interpolates a small number of focus measure values to obtain
accurate depth estimates. A fully automated shape from focus system has
been implemented using an optical microscope and tested on a variety of
industrial samples. Experimental results are presented that demonstrate
the accuracy and robustness of the proposed method. These results
suggest shape from focus to be an effective approach for a variety of
challenging visual inspection tasks
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