Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Bar code waveform recognition using peak locations
Joseph, E.   Pavlidis, T.  
R&D Dept., Symbol Technol. Inc., Bohemia, NY ;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jun 1994
Volume: 16,  Issue: 6
On page(s): 630-640
ISSN: 0162-8828
References Cited: 22
CODEN: ITPIDJ
INSPEC Accession Number: 4722519
Digital Object Identifier: 10.1109/34.295907
Current Version Published: 2002-08-06

Abstract
Traditionally, zero crossings of the second derivative provide edge features for the classification of blurred waveforms. The accuracy of these edge features deteriorates in the case of severely blurred images. In this paper, a new feature is presented that is more resistant to the blurring process, the image, and waveform peaks. In addition, an estimate of the standard deviation σ of the blurring kernel is used to perform minor deblurring of the waveform. Statistical pattern recognition is used to classify the peaks as bar code characters. The noise tolerance of this recognition algorithm is increased by using an adaptive, histogram-based technique to remove the noise. In a bar code environment that requires a misclassification rate of less than one in a million, the recognition algorithm showed a 43% performance improvement over current commercial bar code reading equipment

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (960 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved