Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Radiometric CCD camera calibration and noise estimation
Healey, G.E.   Kondepudy, R.  
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Mar 1994
Volume: 16,  Issue: 3
On page(s): 267-276
ISSN: 0162-8828
References Cited: 26
CODEN: ITPIDJ
INSPEC Accession Number: 4679815
Digital Object Identifier: 10.1109/34.276126
Current Version Published: 2002-08-06

Abstract
Changes in measured image irradiance have many physical causes and are the primary cue for several visual processes, such as edge detection and shape from shading. Using physical models for charged-coupled device (CCD) video cameras and material reflectance, we quantify the variation in digitized pixel values that is due to sensor noise and scene variation. This analysis forms the basis of algorithms for camera characterization and calibration and for scene description. Specifically, algorithms are developed for estimating the parameters of camera noise and for calibrating a camera to remove the effects of fixed pattern nonuniformity and spatial variation in dark current. While these techniques have many potential uses, we describe in particular how they can be used to estimate a measure of scene variation. This measure is independent of image irradiance and can be used to identify a surface from a single sensor band over a range of situations. Experimental results confirm that the models presented in this paper are useful for modeling the different sources of variation in real images obtained from video cameras

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (828 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved