A metric for line segments
Nacken, P.F.M.
Center for Math. & Comput. Sci., Amsterdam ;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Dec 1993
Volume: 15,
Issue: 12
On page(s): 1312-1318
ISSN: 0162-8828
References Cited: 10
CODEN: ITPIDJ
INSPEC Accession Number: 4609828
Digital Object Identifier: 10.1109/34.250848
Current Version Published: 2002-08-06
Abstract
This correspondence presents a metric for describing line
segments. This metric measures how well two line segments can be
replaced by a single longer one. This depends for example on
collinearity and nearness of the line segments. The metric is
constructed using a new technique using so-called neighborhood
functions. The behavior of the metric depends on the neighborhood
function chosen. In this correspondence, an appropriate choice for the
case of line segments is presented. The quality of the metric is
verified by using it in a simple clustering algorithm that groups line
segments found by an edge detection algorithm in an image. The fact that
the clustering algorithm can detect long linear structures in an image
shows that the metric is a good measure for the groupability of line
segments
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