Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A constrained approach to multifont Chinese character recognition
Huang, X.   Gu, J.   Wu, Y.  
Dept. of Electr. & Comput. Eng., Calgary Univ., Alta.;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Aug 1993
Volume: 15,  Issue: 8
On page(s): 838-843
ISSN: 0162-8828
References Cited: 18
CODEN: ITPIDJ
INSPEC Accession Number: 4500761
Digital Object Identifier: 10.1109/34.236243
Current Version Published: 2002-08-06

Abstract
The constraint graph is introduced as a general character representation framework for recognizing multifont, multiple-size Chinese characters. Each character class is described by a constraint graph model. Sampling points on a character skeleton are taken as nodes in the graph. Connection constraints and position constraints are taken as arcs in the graph. For patterns of the same character class, the model captures both the topological invariance and the geometrical invariance in a general and uniform way. Character recognition is then formulated as a constraint-based optimization problem. A cooperative relaxation matching algorithm that solves this optimization problem is developed. A practical optical character recognition (OCR) system that is able to recognize multifont, multiple-size Chinese characters with a satisfactory performance was implemented

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (524 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved