Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Classification trees with neural network feature extraction
Guo, H.   Gelfand, S.B.  
CIC Corp., Redwood Shores, CA;

This paper appears in: Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Publication Date: 15-18 Jun 1992
On page(s): 183-188
Meeting Date: 06/15/1992 - 06/18/1992
Location: Champaign, IL, USA
ISBN: 0-8186-2855-3
References Cited: 10
INSPEC Accession Number: 4382926
Digital Object Identifier: 10.1109/CVPR.1992.223275
Current Version Published: 2002-08-06

Abstract
The use of small multilayer nets at the decision nodes of a binary classification tree to extract nonlinear features is proposed. This approach exploits the power of tree classifiers to use appropriate local features at the different levels and nodes of the tree. The nets are trained and the tree is grown using a gradient-type learning algorithm in conjunction with a heuristic class aggregation algorithm. The method improves on standard classification tree design methods in that it generally produces trees with lower error rates and fewer nodes. It also provides a structured approach to neural network classifier design which reduces the problem associated with training large unstructured nets, and transfers the problem of selecting the size of the net to the simpler problem of finding the right size tree. Example concern waveform and handwritten character recognition

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (420 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved