Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Simple direct computation of the FOE with confidence measures
Negahdaripour, S.   Ganesan, V.  
Miami Univ., Coral Gables, FL;

This paper appears in: Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Publication Date: 15-18 Jun 1992
On page(s): 228-235
Meeting Date: 06/15/1992 - 06/18/1992
Location: Champaign, IL, USA
ISBN: 0-8186-2855-3
References Cited: 11
INSPEC Accession Number: 4382931
Digital Object Identifier: 10.1109/CVPR.1992.223270
Current Version Published: 2002-08-06

Abstract
A direct method is proposed for locating the focus of expansion, based on simple parallel computations in selected regions of the image; each is a circular patch around an estimated focus of expansion (FOE). Simple computations allow determining the direction from the estimated to the true 400FOE. The best estimate of the intersection of the so-called FOE constraint lines for each region gives the location of the FOE. Some analysis allows a confidence measure to be assigned to the information from each local region, in order to give more weighting to the most reliable data. Hence, the FOE can be located with more accuracy, even when the data from various local regions lack sufficient information

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (864 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved