Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Adaptive meshes and shells: irregular triangulation,discontinuities, and hierarchical subdivision
Vasilescu, M.   Terzopoulos, D.  
Artificial Intelligence Lab., MIT, Cambridge, MA ;

This paper appears in: Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Publication Date: 15-18 Jun 1992
On page(s): 829-832
Meeting Date: 06/15/1992 - 06/18/1992
Location: Champaign, IL, USA
ISBN: 0-8186-2855-3
References Cited: 10
INSPEC Accession Number: 4387772
Digital Object Identifier: 10.1109/CVPR.1992.223247
Current Version Published: 2002-08-06

Abstract
The adaptive mesh model is extended in several ways. Open adaptive meshes and closed adaptive shells based on triangular and rectangular elements are developed. A discontinuity detection and preservation algorithm suitable for the model is proposed. Techniques for adaptive hierarchical subdivision of adaptive meshes and shells are also developed. The extended model is applied to image and 3D surface data

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (428 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved