Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Multi-resolution surface modeling from multiple range views
Soucy, M.   Laurendeau, D.  
Dept. of Electr. Eng., Laval Univ., Quebec City, Que.;

This paper appears in: Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Publication Date: 15-18 Jun 1992
On page(s): 348-353
Meeting Date: 06/15/1992 - 06/18/1992
Location: Champaign, IL, USA
ISBN: 0-8186-2855-3
References Cited: 10
INSPEC Accession Number: 4399857
Digital Object Identifier: 10.1109/CVPR.1992.223166
Current Version Published: 2002-08-06

Abstract
A multiresolution surface modeling technique is presented. Several registered range views obtained from different viewpoints are first integrated into a nonredundant surface triangulation. The integration technique is based on the reparameterization of the canonic subsets of the Venn diagram of the set of views. The resulting triangulation is then input to a sequential optimization process that computes different levels of resolution of the surfaces of interest

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (564 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved