Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Hierarchical waveform matching: a new feature-based stereotechnique
McKeown, D.M., Jr.   Hsieh, Y.C.  
Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA;

This paper appears in: Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Publication Date: 15-18 Jun 1992
On page(s): 513-519
Meeting Date: 06/15/1992 - 06/18/1992
Location: Champaign, IL, USA
ISBN: 0-8186-2855-3
References Cited: 15
INSPEC Accession Number: 4399881
Digital Object Identifier: 10.1109/CVPR.1992.223142
Current Version Published: 2002-08-06

Abstract
A feature-based stereo matching system that is based on an algorithm for one-dimensional waveform matching is described. It is intended for use in automated cartography, to generate an accurate three-dimensional model of man-made structures and natural terrain. Each epipolar line in the stereo pair is represented as a one-dimensional intensity waveform. The waveform is described as a collection of features, such as peaks and valleys, and represented across a set of hierarchical levels, computed by approximation from the original waveform. These features are matched using an evaluation function that factors similarity of waveform shape, intensity, and symbolic feature description. Waveform matches at coarse resolution are used to constrain matches at finer levels. Intra/inter-scanline corrections are applied and the actual position of the stereo match is adjusted by using the gradient representation of the original waveform. Some representative results are presented for a complex urban scene

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (864 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved